1.

Conference Proceedings
Conference Proceedings
1. The Role of Vacancies and Oxygen for Setting up an Efficient Getter for Cu and Ni in Silicon Wafers
D. Kot ; G. Kissinger ; W. Haeckl ; A. Sattler ; W. Von Ammon
Pub. info.: High Purity Silicon 10.  pp.207-218,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(6)
2.

Conference Proceedings
Conference Proceedings
2. Verification of a Method to Detect Grown-in Oxide Precipitate Nuclei in Czochralski Silicon
G. Kissinger ; A. Sattler ; J. Dabrowski ; W. Von Ammon
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices and processes 7.  pp.161-171,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 11(3)
3.

Conference Proceedings
Conference Proceedings
3. Analytical Modeling of the Interaction of Vacancies and Oxygen for Oxide Precipitation in RTA Treated Wafers
G. Kissinger ; J. Dabrowski ; A. Sattler ; C. Seuring ; T. Mueller ; H. Richter ; W. Von Ammon
Pub. info.: Silicon materials science and technology X.  pp.247-260,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 2(2)