1.
Conference Proceedings
K. Chiu ; C. Chen ; P. Chen ; W. Ho
Pub. info.:
Micro Power Sources . pp.1-9, 2009. Pennington, NJ. Electrochemical Society
Title of ser.:
ECS transactions
Ser. no.:
16(26)
2.
Conference Proceedings
S. Gao ; W. Ho
Pub. info.:
Laser techniques for surface science II : 12-14 July 1995, San Diego, California . pp.97-109, 1995. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2547
3.
Conference Proceedings
R.A. Pelak ; M.F. Booth ; D.G. Busch ; S. Gao ; W. Ho
Pub. info.:
Laser techniques for surface science II : 12-14 July 1995, San Diego, California . pp.62-72, 1995. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2547
4.
Technical Paper
J. Koo ; W. Ho ; O. Ezekoye
Pub. info.:
AIAA meeting papers on disc . 2006. Reston, Va. American Institute of Aeronautics and Astronautics
Title of ser.:
AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.:
2006
5.
Technical Paper
J. Koo ; W. Ho ; M. Bruns ; O. Ezekoye
Pub. info.:
AIAA meeting papers on disc . 2007. Reston, Va.. American Institute of Aeronautics and Astronautics
Title of ser.:
AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
Ser. no.:
2007
6.
Technical Paper
K. Nguyen ; J. Koo ; W. Ho ; M. Bruns ; O. Ezekoye
Pub. info.:
AIAA meeting papers on disc . 2007. Reston, Va.. American Institute of Aeronautics and Astronautics
Title of ser.:
AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.:
2007
7.
Technical Paper
J. Koo ; W. Ho ; M. Bruns ; O. Ezekoye
Pub. info.:
AIAA meeting papers on disc . 2007. Reston, Va.. American Institute of Aeronautics and Astronautics
Title of ser.:
AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.:
2007
8.
Conference Proceedings
A. Tay ; W. Ho ; N. Hu ; C. Kiew ; K. Tsai
Pub. info.:
Metrology, inspection, and process control for microlithography XXI . 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6518