Visitserngtrakul, S. ; Jung, C. O. ; Cordts, B. F. ; Roitman, P. ; Krause, S. J.
Pub. info.:
High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA. pp.135-140, 1990. Pittsburgh, Pa.. Materials Research Society
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.955-960, 1990. Pittsburgh, Pa.. Materials Research Society