1.

Conference Proceedings
Conference Proceedings
1. Spatial Characterization of Doped SiC Wafers by Raman Spectroscopy
Burton, J.C. ; Sun, L. ; Pophristic, M. ; Lukacs, S. ; Cohen, S. ; Long, F.H. ; Liang, S. ; Lu, Y. ; Feng, Z.C. ; Li, Y. ; Tran, C.
Pub. info.: Proceedings of the Second Symposium on III-V Nitride Materials and Processes.  pp.220-227,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-34
2.

Conference Proceedings
Conference Proceedings
2. Time-resolved spectroscopy of InGaN
Pophristic, M. ; Long, F. H. ; Tran, C. ; Ferguson, I. T.
Pub. info.: GaN and related alloys - 1999 : symposium held November 28-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.W11.58.1-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 595
3.

Conference Proceedings
Conference Proceedings
3. Time-Resolved Photoluminescence Measurements of InGaN Light-Emitting Diodes
Pophristic, M. ; Long, F. H. ; Tran, C. ; Ferguson, I. T.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1623-1626,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)