1.

Conference Proceedings
Conference Proceedings
1. FTIR Absorption aud Photoluminescence Study of a New Defect System in GaP:Fe:S
Schneider,J.M. ; Thonke,K. ; Ulrici,W. ; Sauer,R.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.323-328,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings
Conference Proceedings
2. Photoluminescence,optical absorption,and EPR studies of the CO2+- Sp pair defect in GaP
Goser,R. ; Kreissl,J. ; Thonke,K. ; Ulrici,W.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1069-1074,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. Novel Very Slow Photoluminescence Processes at Transition Metal Ions in III-V Semiconductors
Thonke,K. ; Baier,T. ; Hamann,J. ; Scheerer,O. ; Sauer,R. ; Ulrici,W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1521-1526,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
4.

Conference Proceedings
Conference Proceedings
4. Piezo-Spectroscopic Study of the V3+ photoluminescence in GaP:V:S
Steck,S. ; Rtickert,G. ; Thonke,K. ; Ulrici,W. ; Sauer,R.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.731-736,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
5.

Conference Proceedings
Conference Proceedings
5. Resonance-mode phonon replica in the optical spectra of transition-metal impurities in GaP
Schrepel,C. ; Scherz,U. ; Ulrici,W. ; Thonke,K.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1075-1080,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263