1.

Conference Proceedings
Conference Proceedings
1. A CALORIMETRIC STUDY OF THE KINETICS OF Al3Ni NUCLEATION AND GROWTH DURING REACTIONS IN Al/Ni THIN FILMS
Ma, E. ; Thompson, C.V. ; Clevenger, L.A.
Pub. info.: Kinetics of phase transformations : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.203-208,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 205
2.

Conference Proceedings
Conference Proceedings
2. THE MICROSTRUCTURE OF GOLD FILMS WRITTEN BY FOCUSED ION BEAM INDUCED DEPOSITION
Blauner, P.G. ; Ro, J.S. ; Butt, Y. ; Thompson, C.V. ; Melngailis, J.
Pub. info.: Laser and particle-beam chemical processes on surfaces : symposium held November 29-December 2, 1988, Boston, Massachusetts, U.S.A..  pp.483-488,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 129
3.

Conference Proceedings
Conference Proceedings
3. SOLIDIFICATION INTERFACE MORPHOLOGIES IN ZONE MELTING RECRYSTALLIZATION
Im, J.S. ; Thompson, C.V. ; Tomita, H.
Pub. info.: Beam-solid interactions and transient processes : symposium held December 1-4, 1986, Boston, Massachusetts, U.S.A..  pp.555-560,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 74
4.

Conference Proceedings
Conference Proceedings
4. NUMERICAL MODELING OF ENERGY-BEAM INDUCED LOCALIZED MELTING OF THIN Si FILMS
Im, J.S. ; Lipman, J.D. ; Miaoulis, I.N. ; Chen, C.K. ; Thompson, C.V.
Pub. info.: Beam-solid interactions : physical phenomena : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.455-460,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 157
5.

Conference Proceedings
Conference Proceedings
5. STRUCTURAL TRANSITIONS IN TITANIUM/AMORPHOUS-SILICON MULTILAYERS
Ma, E. ; Clevenger, L.A. ; Thompson, C.V. ; DeAvillez, R.R. ; Tu, K.N.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.961-964,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
6.

Conference Proceedings
Conference Proceedings
6. MODELLING OF THIN FILM GRAIN STRUCTURES AND GRAIN GROWTH
Frost, H.J. ; Thompson, C.V.
Pub. info.: Computer-based microscopic description of the structure and properties of materials : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.233-240,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 63
7.

Conference Proceedings
Conference Proceedings
7. Length Effects On The Reliability Of Dual-Damascene Cu Interconnects
Wei, F. ; Gan, C.L. ; Thompson, C.V. ; Clement, J.J. ; Hau-Riege, S.P. ; Pey, K.L. ; Choi, W.K. ; Tay, H.L. ; Yu, B. ; Radhakrishnan, M.K.
Pub. info.: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.645-650,  2002.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 716
8.

Conference Proceedings
Conference Proceedings
8. * CRYSTALLINE FILMS ON AMORPHOUS SUBSTRATES BY ZONE MELTING AND SURFACE-ENERGY-DRIVEN GRAIN GROWTH IN CONJUNCTION WITH PATTERNING
Smith, H.I. ; Geis, M.W. ; Thompson, C.V. ; Chen, C.K.
Pub. info.: Semiconductor-on-insulator and thin film transistor technology : symposium held December 3-6, 1985, Boston, Massachusetts, U.S.A..  pp.3-14,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 53
9.

Conference Proceedings
Conference Proceedings
9. THE EFFECTS OF DOPANTS ON SURFACE-ENERGY-DRIVEN SECONDARY GRAIN GROWTH IN ULTRATHIN Si FILMS
Kim, H.-J. ; Thompson, C.V.
Pub. info.: Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA.  pp.729-734,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 54
10.

Conference Proceedings
Conference Proceedings
10. The Effects Of The Mechanical Properties Of The Confinement Material On Electromigration In Metallic Interconnects
Hau-Riege, S.P. ; Thompson, C.V.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D10.2/G7.2-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612
11.

Conference Proceedings
Conference Proceedings
11. Reliability Issues for Submicron Interconnects and Vias
Thompson, C.V.
Pub. info.: Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects.  pp.176-180,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-1
12.

Conference Proceedings
Conference Proceedings
12. Multi-Via Electromigration Test Structures for Identification and Characterization of Different Failure Mechanisms
Choi, Z.-S. ; Chang, C.W. ; Lee, J.H. ; Gan, C.L. ; Thompson, C.V. ; Pey, K.L. ; Choi, W.K.
Pub. info.: Materials, technology and reliability of advanced interconnects - 2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.271-276,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 863
13.

Conference Proceedings
Conference Proceedings
13. Experimental Characterization Of The Reliability Of 3-Terminal Dual-Damascene Copper Interconnect Trees
Gan, C.L. ; Thompson, C.V. ; Pey, K.L. ; Choi, W.K. ; Wei, F. ; Yu, B. ; Hau-Riege, S.P.
Pub. info.: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.431-438,  2002.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 716
14.

Conference Proceedings
Conference Proceedings
14. Circuit-Level And Layout-Specific Interconnect Reliability Assessments
Hau-Riege, S.P. ; Thompson, C.V. ; Hau-Riege, C.S. ; Andleigh, V.K. ; Chery, Y. ; Troxel, D.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D2.2-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612
15.

Conference Proceedings
Conference Proceedings
15. The Effects Of Width Transitions On The Reliability Of Interconnects
Hau-Riege, C.S. ; Thompson, C.V. ; Narieb, T.N.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D2.8-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612
16.

Conference Proceedings
Conference Proceedings
16. Experimental Studies Of The Reliability Of Interconnect Trees
Hau-Riege, S.P. ; Thompson, C.V.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D8.7-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612
17.

Conference Proceedings
Conference Proceedings
17. Fatal Void Size Comparisons in Via-Below and Via-Above Cu Dual-Damascene Interconnects
Choi, Z.-S. ; Gan, C.L. ; Wei, F. ; Thompson, C.V. ; Lee, J.H. ; Pey, K.L. ; Choi, W.K.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics - 2004 : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.373-378,  2004.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 812
18.

Conference Proceedings
Conference Proceedings
18. Mortality Dependence of Cu Dual Damascene Interconnects on Adjacent Segment
Chang, C.W. ; Gan, C.L. ; Thompson, C.V. ; Pey, K.L. ; Choi, W.K. ; Hwang, N.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics - 2004 : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.339-344,  2004.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 812