Geoinformatics 2006 : Geospatial information technology : 28-29 October 2006, Wuhan, China. pp.64211J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Tang, C. ; Gao, Q. ; Chai, Z. ; Wu, D. ; Tong, L. ; Gao, S. ; Zhang, K.
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Solid state lasers and amplifiers : 27-29 April 2004, Strasbourg, France. pp.353-358, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A.. pp.385-390, 1986. Pittsburgh, Pa.. Materials Research Society
Lynch, P.A. ; Cheary, R.W. ; Dooryhee, E. ; Armstrong, N. ; Tang, C.
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EPDIC 7 : proceedings of the seventh European Powder Diffraction Conference, held May 20-23, 2000 in Barcelona, Spain. pp.358-363, 2001. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Materials in space -- science, technology and exploration : symposium held November 29-December 2, 1998, Boston, Massachusetts, U.S.A.. pp.281-284, 1999. Warrendale, Pa.. Materials Research Society
Rare earths '98 : proceedings of the International Conference on Rare Earths, held in Fremantle, Western Australia, October 25-30, 1998. pp.348-353, 1999. Zuerich, Switzerland. Trans Tech Publications
Zuniga, F. ; Cliff, S. ; Kinney, D. ; Hawke, V. ; Smith, S. ; Tang, C.
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A collection of technical papers, AIAA Atmospheric Flight Mechanics Conference, Monterey, California, 5-8 August 2002. v. 2 pp.1093-1109, 2002. Reston, VA. American Institute of Aeronautics and Astronautics
Title of ser.:
AIAA Paper : AIAA Atmospheric Flight Mechanics Conference
Recent Developments in Traceable Dimensional Measurements II. pp.300-307, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Recent Developments in Traceable Dimensional Measurements II. pp.70-79, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Steele, D.A. ; Coniglio, A. ; Tang, C. ; Singh, B. ; Nip, S. ; Spanos, C.J.
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Metrology, Inspection, and Process Control for Microlithography XVI. Part One pp.517-530, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Zhang, Q. ; Friedberg, P.D. ; Tang, C. ; Singh, B. ; Poolla, K. ; Spanos, C.J.
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Metrology, Inspection, and Process Control for Microlithography XVIII. pp.276-286, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Friedberg, P.D. ; Tang, C. ; Singh, B. ; Brueckner, T. ; Gruendke, W. ; Schulz, B. ; Spanos, C.J.
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Metrology, Inspection, and Process Control for Microlithography XVIII. pp.703-712, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
XIV International Symposium on Gas Flow, Chemical Lasers, and High-Power Lasers. pp.509-512, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering