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Conference Proceedings

1. Detection of DNA π-Stack Lesions Using Scanning Electrochemical Microscopy

W. Hammond ; J. Arndt ; T. Nguyen ; K. Slowinska ; C. Jackson

Pub. info.:	Biological Nanostructures, Materials, and Applications. pp.55-62, 2009. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(38)

Conference Proceedings

2. Multiple Defect Modes in Diamond Photonic Crystal

M. Thitsa ; T. Nguyen ; S. Albin

Pub. info.:	Solid State (General) - 214th ECS Meeting/PRiME 2008. pp.71-77, 2009. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(40)

Conference Proceedings

3. Prediction of the Hardened Layer in Traverse Cylindrical Grinding-Hardening

T. Nguyen ; L.C. Zhang

Pub. info.:	Advances in materials manufacturing science and technology XIV : selected, peer reviewed papers from the 14th International Manufacturing Conference in China (IMCC2011), October 13-15, 2011, Tianjin, China. pp.13-18, 2011. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	697-698

Conference Proceedings

4. Influence of the Synthetic Procedures on the Optoelectronic Properties of CdSe Nanodots

U. Farva ; Y. Na ; Y. Kim ; D. Kim ; T. Nguyen

Pub. info.:	Analytical and diagnostic techniques for semiconductor materials, devices and processes 7. pp.183-186, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(3)

Conference Proceedings

5. Technologies to Improve Productivity and Reduce Tooling Costs in High Pressure Die Casting (HPDC)

G. Savage ; L.H. Wang ; T. Nguyen

Pub. info.:	Light Metals Technology V : Selected, peer reviewed papers from the 5th International Conference on Light Metals Technology, July 19-22, 2011, Luneburg, Germany. pp.112-115, 2011. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	690

Conference Proceedings

6. Modelling Die Filling in Ultra-Thin Aluminium Castings

T. Nguyen ; V. Nguyen ; M. Murray ; G. Savage ; J. Carrig

Pub. info.:	Light Metals Technology V : Selected, peer reviewed papers from the 5th International Conference on Light Metals Technology, July 19-22, 2011, Luneburg, Germany. pp.107-111, 2011. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	690

Conference Proceedings

7. Influence of Annealing Treatments on the Morphology and Electrical Properties of GeOI Substrates Obtained by Ge Condensation

J. Damlencourt ; Y. Campidelli ; T. Nguyen ; B. Vincent ; C. Le Royer ; Y. Morand ; S. Cristoloveanu ; L. Clavelier

Pub. info.:	Advanced gate stack, source/drain and channel engineering for Si-based CMOS 3 : new materials, processes and equipment. pp.65-72, 2007. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	6(1)

Conference Proceedings

8. Composite-copper, low-thermal-resistance heat sinks for laser-diode bars, mini-bars and single-emitter devices

R. Miller ; D. Liu ; M. Horsinka ; T. Nguyen ; K. Kuppuswamy

Pub. info.:	High-power diode laser technology and applications VI : 21-23 January 2008, San Jose, California, USA. pp.687607-1-687607-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6876

Conference Proceedings

9. High Hole Mobility SGOI Substrates Obtained by the Germanium Condensation Technique

L. Souriau ; T. Nguyen ; E. Augendre ; R. Loo ; V. Terzieva

Pub. info.:	SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices. pp.79-89, 2008. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(10)

10.

Conference Proceedings

10. Epitaxial Regrowth of Ge on SGOI and GeOI Su,bstrates Obtained by Ge Condensation

J. Damlencourt ; Y. Campidelli ; M. Roure ; B. Vincent ; E. Martinez ; F. Fillot ; B. Arrazat ; T. Nguyen ; S. Cristoloveanu ; L. Clavelier ; Y. Morand

Pub. info.:	Silicon-on-insulator technology and devices 13. pp.315-320, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	6(4)

11.

Conference Proceedings

11. Mobility Characterization by Magnetoresistance in Ultra Thin SOI Ring-FETs

T. V. Chandrasekhar Rao ; S. Cristoloveanu ; J. Antoszewski ; T. Nguyen ; H. Hovel ; P. Genlil ; L. Faraone

Pub. info.:	Silicon-on-insulator technology and devices 13. pp.279-286, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	6(4)

12.

Conference Proceedings

12. Origin of Transient Gate Current Observed in Pseudo-MOS Transistor

S. Sato ; T. Nguyen ; S. Cristoloveanu ; Y. Omura

Pub. info.:	Silicon-on-insulator technology and devices 13. pp.95-100, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	6(4)

13.

Conference Proceedings

13. Tuning the Electrostatic Properties of Silicon-on-Insulating Multilayer (SOIM) Structures

M. Kostrzewa ; T. Nguyen ; J. Mazellier ; C. Deguet ; L. Clavelier

Pub. info.:	Semiconductor Wafer Bonding 10: Science, Technology, and Applications. pp.187-194, 2008. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(8)

14.

Conference Proceedings

14. Small animal PET imager built with plastic scintillating fibers

J.L. Fernando ; R. Xiong ; T. Nguyen ; J.A. Anderson ; G. Arbique

Pub. info.:	Photoelectronic detectors, cameras, and systems : 13-14 July, 1995, San Diego, California. pp.102-107, 1995. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2551

15.

Conference Proceedings

15. Manufacturing issues in copper chemical vapor deposition processes

T. Nguyen ; L.R. Allen ; S.-T. Hsu

Pub. info.:	Microelectronics technology and process integration : 20-21 October 1994, Austin, Texas. pp.91-97, 1994. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2335

16.

Technical Paper

16. Radiosotope Electric Propulsion Centaur Orbiter Spacecraft Design Overview

S. Oleson ; M. Mcguire ; T. Sarver-Verhey ; J. Juergens ; T. Parkey ; J. Dankanich ; D. Fiehler ; J. Gyekenyesi ; J. Gilland ; T. Colozza ; T. Packard ; T. Nguyen ; P. Schmitz

Pub. info.:	AIAA meeting papers on disc. 2008. Reston, Va.. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.:	2008

17.

Technical Paper

17. After-Impact Compressive Strength Prediction for Laminated Composites

T. Nguyen ; Y. Zhao ; E. Hill ; C. Wang

Pub. info.:	AIAA meeting papers on disc. 2006. [Reston, Va.]. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
Ser. no.:	2006

18.

Technical Paper

18. Prediction of Fade Statistics in LMS Systems from Hemispherical Images in Canada

C. Amaya ; T. Nguyen

Pub. info.:	AIAA meeting papers on disc. 2006. Reston, Va. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : AIAA International Communications Satellite Systems Conference
Ser. no.:	2006

19.

Technical Paper

19. The Exploration Development Lab - Industry Investments Supporting Constellation Risk Reduction

S. Stagliano ; T. Nguyen ; P. Goodwin ; M. Tichenor

Pub. info.:	AIAA meeting papers on disc. 2008. Reston, Va.. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : AIAA Space Conference and Exposition
Ser. no.:	2008

20.

Technical Paper

20. Development of a 6-DOF Model for Mine Clearing Darts

K. Watson ; M. Neaves ; T. Nguyen

Pub. info.:	AIAA meeting papers on disc. 2006. Reston, Va.. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.:	2006

21.

Conference Proceedings

21. Next-generation active and passive heatsink design for diode lasers

R. Srinivasan ; R. Miller ; K. Kuppuswamy ; T. Nguyen ; Y. Hu ; H. Li ; D. Brown ; T. Towe ; T. Crum ; B. Morris ; E. Wolak ; J. Harrison

Pub. info.:	High-power diode laser technology and applications V : 22-24 January 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6456

22.

Conference Proceedings

22. Ongoing development of high-efficiency and high-reliability laser diodes at Spectra-Physics

H. Li ; I. Chyr ; D. Brown ; X. Jin ; F. Reinhardt ; T. Towe ; T. Nguyen ; R. Srinivasan ; M. Berube ; R. Miller ; K. Kuppuswamy ; Y. Hu ; T. Crum ; T. Truchan ; J. Harrison

Pub. info.:	High-power diode laser technology and applications V : 22-24 January 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6456

23.

Conference Proceedings

23. Design and modeling of a mixed mode magnetorheological (MR) fluid mount

C. Ciocanel ; T. Nguyen ; M. Elahinia

Pub. info.:	Active and passive smart structures and integrated systems 2008. pp.69281C-1-69281C-10, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6928

24.

Conference Proceedings

24. Coding and optimization of a fully scalable motion model

M.-P. Kao ; T. Nguyen

Pub. info.:	Applications of digital image processing XXX. 1 pp.669610-1-669610-12, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6696

25.

Conference Proceedings

25. Fabry-Perot MEMS microspectrometers spanning the SWIR and MWIR

A. J. Keating ; J. Antoszewski ; K. K. M. B. D. Silva ; K. J. Winchester ; T. Nguyen ; J. M. Dell ; C. A. Musca ; L. Faraone ; O. Samardzic

Pub. info.:	Infrared technology and applications XXXIII : 9-13 April 2007, Orlando, Florida, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6542

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