1.

Conference Proceedings
Conference Proceedings
1. Measurement of opaque film's surface profile by broadband-light interference methods
Zhu, Y. ; Sun, Y. ; Zhao, H. ; Zhao, W.
Pub. info.: Advanced sensor systems and applications II : 8-12 November 2004, Beijing, China.  pp.733-738,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5634
2.

Conference Proceedings
Conference Proceedings
2. Digital holography and its application (Invited Paper)
Zhang, Y. ; Lu, Q. ; Ge, B. ; Zhao, H. ; Sun, Y.
Pub. info.: Holography, diffractive optics, and applications II : 8-11 November 2004, Beijing, China.  pp.200-211,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5636
3.

Conference Proceedings
Conference Proceedings
3. Analysis of Double Peak phenomenon in detecting the thickness of thin film [6150-118]
Sun, Y. ; Li, M. ; Zhao, H. ; Zhang, L.
Pub. info.: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment.  pp.61504T-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6150