1.

Conference Proceedings
Conference Proceedings
1. Influence of Electron Irradiation Induced Defects on the Current-Voltage Characteristics of a Resonant Tunneling Diode
Grandidier,B. ; Stievenard,D. ; Deresmes,D. ; Vanbcsien,O. ; Lippens,D. ; Lorriaux,J.L. ; Zazoui,M.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1553-1558,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings
Conference Proceedings
2. Spin Dependent Recombination:an Improved Theory Applied to Deep Centers in Silicon
Lannoo,M. ; Stievenard,D. ; Deresmes,D. ; Vuillaume,D.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1359-1364,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings
Conference Proceedings
3. Electrical Characterization of Surface Defects on Porous p-type Silicon
Cadet,C. ; Deresmes,D. ; Vuillaume,D. ; Stievenard,D. ; Grosman,A. ; Ortega,C. ; Siejka,J. ; Bardeleben,H.J.von
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1475-1480,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
4.

Conference Proceedings
Conference Proceedings
4. Detection Of Defects Responsible for Lifetime in p-Type Si
Zazoui,M. ; Bourgoin,J.C. ; Stievenard,D. ; Deresmes,D.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.189-194,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147