1.

Conference Proceedings
Conference Proceedings
1. Structural Characterization of Different Insulating Films by Spectroscopic Ellipsometry and Grazing X-ray Reflectance
Boher, P. ; Stehle, J. L. ; Hennet, L.
Pub. info.: Amorphous and crystalline insulating thin films--1996 : symposium held December 2-4, 1996, Boston, Massachusetts, U.S.A..  pp.369-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 446
2.

Conference Proceedings
Conference Proceedings
2. Surface Roughness Characterization of Au Thin Films by Spectroscopic Ellipsometry, Grazing X-ray Reflectance, Light Scattering and Scanning Tunneling Microscopy
Boher, P. ; Stehle, J. L.
Pub. info.: Structure and evolution of surfaces : symposium held December 2-5, 1996, Boston, Massachusette, U.S.A..  pp.419-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 440
3.

Conference Proceedings
Conference Proceedings
3. Combine Spectroscopic Ellipsometry and Grazing X-ray Reflectance for Fine Characterization of Complex Epitaxial Structures
Boher, P. ; Stehle, J. L.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.515-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406
4.

Conference Proceedings
Conference Proceedings
4. Single Shot Excimer Laser Annealing of Amorphous Silicon: Effect of Hydrogen on the Properties of the Polysilicon
Boher, P. ; Stehle, M. ; Godard, B. ; Stehle, J. L.
Pub. info.: Advanced laser processing of materials - fundamentals and applications : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.417-,  1996.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 397
5.

Conference Proceedings
Conference Proceedings
5. Crystallization of Si(1-y)Cy Films by Excimer Laser Annealing: Characterization of the Microstructure of the Films
Boher, P. ; Stehle, M. ; Stehle, J. L. ; Fogarassy, E. ; Grob, J. J. ; Grob, A. ; Muller, D.
Pub. info.: Advances in microcrystalline and nanocrystalline semiconductors, 1996 : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.959-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 452
6.

Conference Proceedings
Conference Proceedings
6. Characterization of High-k Dielectrics by Combined Spectroscopic Ellipsometry (SE) and X-Ray Reflectometry (XRR)
Sun, L. ; Defranoux, C. ; Stehle, J. L. ; Boher, P. ; Evrard, P. ; Bellandi, E. ; Bender, H.
Pub. info.: Fundamentals of novel oxide/semiconductor interfaces : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A..  pp.95-102,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 786
7.

Conference Proceedings
Conference Proceedings
7. Combine Spectroscopic Ellipsometry and Grazing X-ray Reflectance for Fine Characterization of Complex Epitaxial Structures
Boher, P. ; Stehle, J. L.
Pub. info.: Surface/interface and stress effects in electronic material nanostructures : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.399-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 405
8.

Conference Proceedings
Conference Proceedings
8. In Situ Real-Time Spectroscopic Ellipsometry Applied to the Surface Monitoring of Semiconductors
Boher, P. ; Stehle, J. L.
Pub. info.: Advances in microcrystalline and nanocrystalline semiconductors, 1996 : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.1025-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 452