1.

Conference Proceedings
Conference Proceedings
1. Overlapping Shockley/Frank Faults in 4F-SiC PiN Diodes
Twigg, M.E. ; Stahlbush, R.E. ; Losee, P.A. ; Li, C.H. ; Bhat, I.B. ; Chow, T.P.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.383-386,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
2.

Conference Proceedings
Conference Proceedings
2. Improving Switching Characteristics of 4H-SiC Junction Rectifiers Using Epitaxial and Implanted Anodes with Epitaxial Refill
Losee, P.A. ; Li, C.H. ; Kumar, R.J. ; Chow, T.P. ; Bhat, I.B. ; Gutmann, R.J. ; Stahlbush, R.E.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.1363-1366,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
3.

Conference Proceedings
Conference Proceedings
3. Stacking Fault Formation Sites and Growth in Thick-Epi SiC PiN Diodes
Stahlbush, R.E. ; Twigg, M.E. ; Irvine, K.G. ; Sumakeris, J.J. ; Chow, T.P. ; Losee, P.A. ; Zhu, L. ; Tang, Y. ; Wang, W.
Pub. info.: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.533-536,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 457-460