1.

Conference Proceedings
Conference Proceedings
1. Structural and Optical Characterization of Polycrystalline Silicon Films Deposited by Single Wafer CVD
Sassela, A. ; Borghesi, A. ; Amore, G. ; Tallarida, G. ; Spiga, S. ; Cazzaniga, F. ; Ferroni, G. ; Queirolo, G.
Pub. info.: Chemical vapor deposition : proceedings of the Fourteenth International Conference and EUROCVD-11.  pp.1282-1288,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-25
2.

Conference Proceedings
Conference Proceedings
2. SCANNING CAPACITANCE FORCE MICROSCOPY AND KELVIN PROBE FORCE MICROSCOPY OF NANOSTRUCTURES EMBEDDED IN SiO2
Tallarida, G. ; Spiga, S. ; Fanciulli, M.
Pub. info.: Scanning probe microscopy : characterization, nanofabrication and device application of functional materials.  pp.405-412,  2005.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 186