1.

Conference Proceedings
Conference Proceedings
1. METALLIC IMPURITIES IN n- AND p-TYPE SILICON: DLTS STUDIES
Agarwal, Aditya ; Radzimaski, Z. J. ; Buczkowski, Z. ; Shimura, F. ; Rozgonyi, G. A.
Pub. info.: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.615-620,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 262
2.

Conference Proceedings
Conference Proceedings
2. DEEP LEVEL ENERGY ANALYSIS OF SURFACE AND BULK DEFECTS USING A NONCONTACT LASER/MICROWAVE PHOTOCONDUCTANCE TECHNIQUE
Buczkowski, A. ; Rozgonyi, G. A. ; Shimura, F.
Pub. info.: Photo-induced space charge effects in semiconductors: electro-optics, photoconductivity, and the photorefractive effect : symposium held April 29-May 1, 1992, San Francisco, California, U.S.A..  pp.235-240,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 261