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Conference Proceedings

1. Optoelectronic technology for detecting flaws on internal surface of cylinder

Che,Y. ; Shen,Y. ; Ma,H.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.451-454, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

Conference Proceedings

2. Development of an optoelectronic instrument for detecting roundness of internal surface of artillery barrel

Che,Y. ; Shen,Y. ; Liu,J.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.186-190, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

Conference Proceedings

3. Research on optoelectronic Technology for detecting rifling of artillery online

Ma,H. ; Che,Y. ; Shen,Y. ; Bai,B.

Pub. info.:	Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.464-469, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2899