1.

Conference Proceedings
Conference Proceedings
1. CHARACTERISTICS OF Si-IMPLANTED (211) VERSUS (100) GaAS
Epp, J. ; Dillard, J.G. ; Siochi, A. ; Zallen, R. ; Cole, E.D. ; Sen, S. ; Vaseashta, A. ; Burton, L.C.
Pub. info.: Processing and characterization of materials using ion beams : symposium held November 28-December 2, 1988, Boston, Massachusetts, U.S.A..  pp.677-682,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 128
2.

Conference Proceedings
Conference Proceedings
2. OPTICAL, CHEMICAL AND ELECTRICAL CHARACTERIZATION OF ION-ETCHED GALLIUM ARSENIDE SURFACES
Feng, G. F. ; Holtz, M. ; Zallen, R. ; Epp. J. M. ; Dillard, J. G. ; Cole, E. ; Johnson, P. ; Sen, S. ; Burton, L. C.
Pub. info.: Materials modification and growth using Ion beams : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.381-384,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 93