1.

Conference Proceedings
Conference Proceedings
1. INFLUENCE OF RAPID THERMAL ANNEALING ON RECOMBINATION PROPERTIES OF POLYCRYSTALLINE SILICON
Kittler, M. ; Seifert, W.
Pub. info.: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.969-974,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 262
2.

Conference Proceedings
Conference Proceedings
2. Modification of Recombination Activity of Dislocations in Si and SiGe by Contamination and Hydrogenation
Kittler, M. ; Seifert, W. ; Higgs, V.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.989-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378
3.

Conference Proceedings
Conference Proceedings
3. SiGe Thin-Film Structures for Solar Cells
Bremond, G. ; Daami, A. ; Laugier, A. ; Seifert, W. ; Kittler, M. ; Poortmans, J. ; Caymax, M. ; Said, K. ; Konuma, M. ; Gutjahr, A. ; Silier, I.
Pub. info.: Thin-film structures for photovoltaics : symposium held December 2-5, 1997, Boston, Massachusetts, U.S.A..  pp.43-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 485
4.

Conference Proceedings
Conference Proceedings
4. Silicon-based light emission after ion implantation
Kittler, M. ; Arguirov, T. ; Seifert, W.
Pub. info.: Optoelectronic Integration on Silicon.  pp.164-171,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5357