Residual stresses VII : ECRS 7 : proceedings of the 7th European conference on residual stresses, Berlin, Germany, 13-15 September 2006. pp.899-904, 2006. Switzerland. Trans Tech Publications
Baranov, A.M. ; Dietsch, R. ; Holz, T. ; Menzel, M. ; Weissbach, D. ; Scholz, R. ; Melov, V. ; Schreiber, J.
Pub. info.:
X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA. pp.160-168, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Iserlohe, C. ; Tecza, M. ; Eisenhauer, F. ; Genzel, R. ; Thatte, N. A. ; Abuter, R. ; Horrobin, M. J. ; Schegerer, A. ; Schreiber, J. ; Bonnet, H.
Pub. info.:
Ground-based instrumentation for astronomy : 21-25 June 2004, Glasgow, Scotland, United Kingdom. pp.1114-1122, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Birkmann, S. M. ; Eberle, K. ; Grozinger, U. ; Lemke, D. ; Schreiber, J. ; Barl, L. ; Katterloher, R. ; Poglitsch, A. ; Schubert, J. ; Richter, H.
Pub. info.:
Optical, infrared, and millimeter space telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom. pp.437-447, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Aksenov, V. L. ; Balagurov, A. M. ; Bokuchava, G. D. ; Schreiber, J. ; Taran, Yu. V.
Pub. info.:
Neutron scattering in materials science II : symposium held November 28-December 1, 1994, Boston, Massachusetts, U.S.A.. pp.415-, 1995. Pittsburgh, Pa.. MRS - Materials Research Society
Tecza, M. ; Eisenhauer, F. ; Iserlohe, C. ; Thatte, N. A. ; Abuter, R. ; Roehrle, C. ; Schreiber, J.
Pub. info.:
Specialized optical developments in astronomy :25-26 August 2002, Waikoloa, Hawaii, USA. pp.375-383, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Taran, Yu.V. ; Daymond, M.R. ; Eifler, D. ; Nebel, Th. ; Schreiber, J.
Pub. info.:
ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002. pp.501-508, 2002. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Bokuchava, G. ; Schreiber, J. ; Shamsutdinov, N. ; Stalder, M.
Pub. info.:
Functionally graded materials 1998 : proceedings of the 5th International Symposium on Functionally Graded Materials, held in New Town Hall, Dresden, Germany, October 26-29, 1998. pp.1018-1023, 1999. Uetikon-Zuerich, Switzerland. Trans Tech Publications
ECRS 5 : proceedings of the Fifth European Conference on Residual Stresses : held September 28-30, 1999 in Delft-Noordwijkerhout, The Netherlands. pp.640-645, 2000. Zurich, Switzerland. Trans Tech Publications
Taran, Yu. V. ; Schreiber, J. ; Mikula, P. ; Lukas, P. ; Neov, D. ; Vrana, M.
Pub. info.:
ECRS 5 : proceedings of the Fifth European Conference on Residual Stresses : held September 28-30, 1999 in Delft-Noordwijkerhout, The Netherlands. pp.322-327, 2000. Zurich, Switzerland. Trans Tech Publications
ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002. pp.797-802, 2002. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Kockelmann, H. ; Schreiber, J. ; Taran, Yu. V. ; Wright, J. S.
Pub. info.:
EPDIC 6 : proceedings of the sixth European Powder Diffraction Conference, held August 22-25, 1998 in Budapest, Hungary. pp.726-731, 2000. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Braun, S. ; Bendjus, B. ; Foltyn, T. ; Menzel, M. ; Schreiber, J. ; Leson, A.
Pub. info.:
Advances in mirror technology for X-ray, EUV lithography, laser, and other applications II : 5 August 2004, Denver, Colorado, USA. pp.75-84, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hildebrandt, S. ; Schreiber, J. ; Kuzmenko, R. ; Gansha, A. ; Kircher, W. ; Horing, L.
Pub. info.:
Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.. pp.259-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
A collection of technical papers : 1st International Energy Conversion Engineering Conference, Portsmouth, Virginia, 17-21 August 2003. pp.1152-1160, 2003. American Institute of Aeronautics and Astronautics
Murray, P. T. ; Koehler, B. ; Lipfert, S. ; Kaspar, J. ; Schreiber, J.
Pub. info.:
Testing, Reliability, and Application of Micro- and Nano-Material Systems IV. pp.61750D-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Koehler, B. ; Murray, P. ; Shin, E. ; Schreiber, J.
Pub. info.:
Testing, Reliability, and Application of Micro- and Nano-Material Systems IV. pp.61750C-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Eisenhauer, F. ; Bonnet, H. ; Abuter, R. ; Bickert, K. ; Biancat-Marchet, F. ; Brynnel, J. ; Conzelmann, R.D. ; Delabre, B. ; Donaldson, R. ; Farinato, J. ; Fedrigo, E. ; Finger, G. ; Genzel, R. ; Hubin, N.N. ; Iserlohe, C. ; Kaper, M.E. ; Kissler-Patig, M. ; Monnet, G.J. ; Roehrle, C. ; Schreiber, J. ; Stroebele, S. ; Tecza, M. ; Thatte, N.A. ; Weisz, H.
Pub. info.:
Instrument Design and Performance for Optical/Infrared Ground-based Telescopes. Part Three pp.1548-1561, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Flippo, A. K. ; Hegelich, M. B. ; Schmitt, J. M. ; Gauthier, C. D. ; Meserole, A. C. ; Fisher, L. G. ; Cobble, A. J. ; Johnson, A. R. ; Letzring, A. S. ; Fernandez, C. J. ; Schollmeier, M. ; Schreiber, J.
Pub. info.:
High-Power Laser Ablation VI. pp.62612I-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Braun, S. ; Bendjus, B. ; Foltyn, T. ; Menzel, M. ; Schreiber, J. ; Weissbach, D.
Pub. info.:
Testing, Reliability, and Application of Micro- and Nano-Material Systems II. pp.132-140, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Schreiber, J. ; Braun, S. ; Gatto, A. ; Schenk, H.
Pub. info.:
Testing, Reliability, and Application of Micro- and Nano-Material Systems II. pp.114-122, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Koehler, B. ; Schreiber, J. ; Bendjus, B. ; Herms, M. ; Melov, V. ; Helfen, L. ; Mikulik, P. ; Baumbach, T.
Pub. info.:
Testing, Reliability, and Application of Micro- and Nano-Material Systems II. pp.63-77, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Schreiber, J. ; Bendjus, B. ; Kyhler, B. ; Melov, V. ; Baumbach, T.
Pub. info.:
Testing, Reliability, and Application of Micro- and Nano-Material Systems II. pp.266-271, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering