1.

Conference Proceedings
Conference Proceedings
1. High-resolution carbon/carbon multilayers
Baranov, A.M. ; Dietsch, R. ; Holz, T. ; Menzel, M. ; Weissbach, D. ; Scholz, R. ; Melov, V. ; Schreiber, J.
Pub. info.: X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA.  pp.160-168,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4782
2.

Conference Proceedings
Conference Proceedings
2. Stress Development in Ni/C-Multilayers on Si-Substrates with Increasing Period Number
Schreiber, J. ; Melov, V. ; Dietsch, R.
Pub. info.: ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002.  pp.797-802,  2002.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 404-407
3.

Conference Proceedings
Conference Proceedings
3. Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance
Koehler, B. ; Schreiber, J. ; Bendjus, B. ; Herms, M. ; Melov, V. ; Helfen, L. ; Mikulik, P. ; Baumbach, T.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems II.  pp.63-77,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5392
4.

Conference Proceedings
Conference Proceedings
4. Materials characterization of micro-devices
Schreiber, J. ; Bendjus, B. ; Kyhler, B. ; Melov, V. ; Baumbach, T.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems II.  pp.266-271,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5392