Schindler, A. ; Haensel, T. ; Nickel, A. ; Thomas, H.-J. ; Lammert, H. ; Siewert, F.
Pub. info.:
Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA. pp.64-72, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Herold, V. ; Lammert, H. ; Schindler, A. ; Schwennicke, R. ; Siewert, F.
Pub. info.:
Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany. pp.596521-596521, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Siewert, F. ; Lammert, H. ; Noll, T. ; Schlegel, T. ; Zeschke, T. ; Hansel, T. ; Nickel, A. ; Schindler, A. ; Grubert, B. ; Schlewitt, C.
Pub. info.:
Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA. pp.592101-592101, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering