1.

Conference Proceedings
Conference Proceedings
1. PHOTOLUMINESCENCE MEASUREMENT OIF SIDEWALL DAMAGE IN ETCHED InGaAsP/InP AND GaAs/A1GaAs MICROSTRUCTURES
Grabbe, P. ; Scherer, A. ; Kash, K. ; Bhat, R. ; Harbison, J. P. ; Florez, L. ; Koza, M
Pub. info.: Advances in materials, processing, and devices in III-V compound semiconductors.  pp.145-150,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 144
2.

Conference Proceedings
Conference Proceedings
2. STRAIN-INDUCED LATERAL CONFINEMENT OF CARRIERS IN SEMI-CONDUCTOR QUANTUM WELLS
Kash, K. ; Bhat, R. ; Mahoney, Derek D. ; Worlock, J. M. ; Lin, P. S. D. ; Scherer, A. ; Gaag, Vad der B. P> ; Koza, M. ; Grabbe, P.
Pub. info.: Advances in materials, processing, and devices in III-V compound semiconductors.  pp.245-250,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 144
3.

Conference Proceedings
Conference Proceedings
3. ANISOTROPIC ION BEAM ASSISTED ETCHING OF OPTICAL STRUCTURES IN GaAs AND InP
Scherer, A. ; Van Der Gaas, B.P. ; Kash, K. ; Craighead, H.G. ; Grabbe, P.
Pub. info.: Advanced surface processes for optoelectronics : symposium held April 5-8, 1988, Reno, Nevada, U.S.A..  pp.245-250,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 126