Photomask and X-ray mask technology IV : 17-18 April, 1997, Kawasaki, Japan. pp.230-239, 1997. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing VI : 11-13 March 1996, Santa Clara, California. pp.222-236, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering