1.

Conference Proceedings
Conference Proceedings
1. A temperature-resistant wide-dynamic-range CMOS image sensor
K. Mizobuchi ; S. Adachi ; T. Yamashita ; S. Okamura ; H. Oshikubo ; N. Akahane ; S. Sugawa
Pub. info.: Sensors, cameras, and systems for scientific/industrial applications VIII : 30 January-1 February 2007, San Jose, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6501
2.

Conference Proceedings
Conference Proceedings
2. A linear response 200-dB dynamic range CMOS image sensor with multiple voltage and current readout operations
N. Ide ; N. Akahane ; S. Sugawa
Pub. info.: Sensors, cameras, and systems for industrial/scientific applications IX : 29-31 January 2008, San Jose, California, USA.  pp.681605-1-681605-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6816
3.

Conference Proceedings
Conference Proceedings
3. A 800(H) x 600(V) high sensitivity and high full well capacity CMOS image sensor with active pixel readout feedback operation
W. Lee ; N. Akahane ; S. Adachi ; K. Mizobuchi ; S. Sugawa
Pub. info.: Sensors, cameras, and systems for industrial/scientific applications IX : 29-31 January 2008, San Jose, California, USA.  pp.68160R-1-68160R-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6816
4.

Conference Proceedings
Conference Proceedings
4. An optimum design of the LOFIC CMOS image sensor for high sensitivity, low noise, and high full well capacity
N. Akahane ; W. Lee ; S. Sugawa
Pub. info.: Digital photography IV : 28-29 January 2008, San Jose, California, USA.  pp.681702-1-681702-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6817