1.

Conference Proceedings
Conference Proceedings
1. New NBTI Lifetime Prediction Method for Ultra Thin SiO₂ Film
K. Watanabe ; R. Kuroda ; A. Teramoto ; S. Sugawa ; T. Ohmi
Pub. info.: Physics and Chemistry of SiO2 and the Si-SiO2 Interface-5.  pp.147-160,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(1)
2.

Conference Proceedings
Conference Proceedings
2. High-Resolution X-Ray Photoelectron Spectroscopy Study on Si₃N₄/Si Interface Structures and Its Correlation with Hysteresis in C(V) Curves
M. Higuchi ; A. Teramoto ; M. Komura ; S. Shinagawa ; E. Ikenaga ; H. Nohira ; K. Kobayashi ; T. Hattori ; S. Sugawa ; T. Ohmi
Pub. info.: Physics and Chemistry of SiO2 and the Si-SiO2 Interface-5.  pp.267-276,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(1)
3.

Conference Proceedings
Conference Proceedings
3. Impact of Improved Mobilities and Suppressed 1/f Noise in Fully Depleted SOI MOSFETs Fabricated on Si(110) Surface
W. Cheng ; A. Teramoto ; C. Tye ; P. Gaubert ; M. Hirayama ; S. Sugawa ; T. Ohmi
Pub. info.: Silicon-on-insulator technology and devices 13.  pp.101-106,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(4)
4.

Conference Proceedings
Conference Proceedings
4. Hot Carrier Instability Mechanism in Accumulation-Mode Normally-off SOI nMOSFETs and Their Reliability Advantage
R. Kuroda ; A. Teramoto ; W. Cheng ; S. Sugawa ; T. Ohmi
Pub. info.: Silicon-on-insulator technology and devices 13.  pp.113-120,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(4)