1.

Conference Proceedings
Conference Proceedings
1. A study on time-space character of urban heat island effect and relations with LUCC based on remote sensing
Y. Yang ; N. Jiang ; S. Cheng ; Y. Li
Pub. info.: Geoinformatics 2007, Geospatial information science : 25-27 May 2007, Nanjing, China.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6753
2.

Conference Proceedings
Conference Proceedings
2. Structural studies of SnS films prepared by thermal evaporation
S. Cheng ; C. Huang ; G. Chen ; G. J. Conibeer
Pub. info.: Micro- and nanotechnology : materials, processes, packaging, and systems III : 11-13 December 2006, Adelaide, Australia.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6415
3.

Conference Proceedings
Conference Proceedings
3. Image fusion based on improved HIS and curvelet transform integrated method
S. Cheng ; Y. Yang ; Y. Li
Pub. info.: Geoinformatics 2007, Remotely sensed data and information : 25-27 May 2007, Nanjing, China.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6752
4.

Conference Proceedings
Conference Proceedings
4. Study of Pr-doped Ceria-based Electrolytes for IT-SOFC
M. Chen ; S. Cheng ; F. Wang ; J. Lee ; Y. Tai
Pub. info.: Solid oxide fuel cells 10 (SOFC-X).  pp.2245-2252,  2007.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 7(1)
5.

Technical Paper
Technical Paper
5. New Mechanisms Governing Local Formability In 3rd Generation AHSS
D.J. Branagan ; A.E. Frerichs ; B.E. Meacham ; S. Cheng ; A.V. Sergueeva
Pub. info.: SAE World Congress Experience : WCX 17 : technical paper.  2017.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2017
6.

Technical Paper
Technical Paper
6. Real-time Pedestrian Detection using Convolutional Neural Network on Embedded Platform
J. Hu ; W. Liu ; S. Cheng ; H. Tian ; H. Yuan
Pub. info.: SAE-TONGJI 2016 Driving Technology of Intelligent Vehicle Symposium : technical paper.  2016.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2016
7.

Technical Paper
Technical Paper
7. A New Type of Low Drag Scramjet Combustor Based on Turbulent Mixing Enhancement
Q. Shen ; F. Guan ; S. Cheng ; N. Zhu ; F. Chen ; D. Qu, ; Z. Li
Pub. info.: AIAA meeting papers on disc.  2008.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : International Space Planes and Hypersonic Systems and Technologies Conference
Ser. no.: 2008
8.

Technical Paper
Technical Paper
8. Ground Operation Concept Testing Requirements and Challenges
S. Cheng ; V. Cheng ; Y. Seo ; L. Martin ; S. Verma ; D. Ballinger
Pub. info.: AIAA meeting papers on disc.  2007.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Modeling and Simulation Technologies Conference
Ser. no.: 2007
9.

Conference Proceedings
Conference Proceedings
9. Accurate and reliable optical CD of MuGFET down to 10nm
P. Leray ; G. F. Lorusso ; S. Cheng ; N. Collaert ; M. Jurczak ; S. Shirke
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518
10.

Conference Proceedings
Conference Proceedings
10. Advanced process control for hyper-NA lithography based on CD-SEM measurement
T. Ishimoto ; K. Sekiguchi ; N. Hasegawa ; T. Maeda ; K. Watanabe ; G. Storms ; D. Laidler ; S. Cheng
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518
11.

Conference Proceedings
Conference Proceedings
11. Comparison of back side chrome focus monitor to focus self-metrology of an immersion scanner
K. D'have ; T. Machida ; D. Laidler ; S. Cheng
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518
12.

Conference Proceedings
Conference Proceedings
12. Pitch doubling through dual-patterning lithography challenges in integration and litho budgets
M. Dusa ; J. Quaedackers ; O. F. A. Larsen ; J. Meessen ; E. van der Heijden ; G. Dicker ; O. Wismans ; P. de Haas ; K. van I. Schenau ; J. Finders ; B. Vleeming ; G. Storms ; P. Jaenen ; S. Cheng ; M. Maenhoudt
Pub. info.: Optical microlithography XX.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6520
13.

Conference Proceedings
Conference Proceedings
13. Split and design guidelines for double patterning
V. Wiaux ; S. Verhaegen ; S. Cheng ; F. Iwamoto ; P. Jaenen
Pub. info.: Optical Microlithography XXI.  1  pp.692409-1-692409-11,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6924
14.

Conference Proceedings
Conference Proceedings
14. Study on classification based on image fusion with curvelet transform
S. Cheng ; Y. Yang ; Y. Li
Pub. info.: MIPPR 2007.  1  pp.67900G-1-67900G-6,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6790
15.

Conference Proceedings
Conference Proceedings
15. Diffraction based overlay metrology: accuracy and performance on front end stack
P. Leray ; S. Cheng ; D. Kandel ; M. Adel ; A. Marchelli
Pub. info.: Metrology, inspection, and process control for microlithography XXII.  1  pp.69220O-1-69220O-12,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6922
16.

Conference Proceedings
Conference Proceedings
16. Sources of overlay error in double patterning integration schemes
D. Laidler ; P. Leray ; K. D'havé ; S. Cheng
Pub. info.: Metrology, inspection, and process control for microlithography XXII.  1  pp.69221E-1-69221E-11,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6922
17.

Conference Proceedings
Conference Proceedings
17. Matching the residual stress between Hafnia and silica for high reflective mirrors
J. Hu ; S. Cheng ; P. Ma ; J. Luo ; Z. Wang
Pub. info.: Advanced optical manufacturing technologies.  2  pp.67222V-1-67222V-5,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6722
18.

Conference Proceedings
Conference Proceedings
18. Integrated analysis of PSInSAR and geological data for investigating local differential settlement of new Hong Kong International Airport
L. Jiang ; Q. Zhao ; S. Cheng ; H. Lin
Pub. info.: International Conference on Earth Observation Data Processing and Analysis (ICEODPA).  3  pp.72854D-1-72854D-10,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7285
19.

Conference Proceedings
Conference Proceedings
19. An algorithm for improving precision of fiber grating's reflective spectrum
S. Cheng ; Z. Li
Pub. info.: International Symposium on Photoelectronic Detection and Imaging 2007, photoelectronic imaging and detection : 9-12 September 2007, Beijing China.  pp.662113-1-662113-6,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6621
20.

Conference Proceedings
Conference Proceedings
20. Performance of an optical identification and interrogation system
A. Venugopalan ; A. K. Ghosh ; P. Verma ; S. Cheng
Pub. info.: Enabling photonics technologies for defense, security, and aerospace applications IV : 17-18 March 2008, Orlando, Florida, USA.  pp.69750C-1-69750C-9,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6975
21.

Conference Proceedings
Conference Proceedings
21. Aerial surveillance vehicles augment security at shipping ports
R. C. Huck ; M. K. Al Akkoumi ; S. Cheng ; J. J. Sluss, Jr. ; T. L. Landers
Pub. info.: Unmanned/unattended sensors and sensor networks V : 16-18 September 2008, Cardiff, Wales, United Kingdom.  pp.71120J-1-71120J-9,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7112