1.

Conference Proceedings
Conference Proceedings
1. Depth-Sensitive Strain Analysis of a W/Ta/W Trilayer
Malhotra, S. G. ; Rek, Z. U. ; Yalisove, S. M. ; Bilello, J. C.
Pub. info.: Thin films - structure and morphology : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.379-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 441
2.

Conference Proceedings
Conference Proceedings
2. Probing Stress State and Phase Content in Ultrathin Ta Films
Whitacre, J. F. ; Rek, Z. U. ; Yalisove, S. M. ; Bilello, J. C.
Pub. info.: Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A..  pp.115-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 524
3.

Conference Proceedings
Conference Proceedings
3. Origins of Residual Stress in Mo and Ta Films: The Role of Impurities, Microstructural Evolution, and Phase Transformations
Parfitt, L. J. ; Karpenko, O. P. ; Rek, Z. U. ; Yalisove, S. M. ; Bilello, J. C.
Pub. info.: Thin films, stresses and mechanical properties VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.505-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 436
4.

Conference Proceedings
Conference Proceedings
4. Degree of Crystallinity and Strain in B4C and SiC Thin Films as a Function of Processing Conditions
Hershberger, J. ; Rek, Z. U. ; Kustas, F. ; Yalisove, S. M. ; Bilello, J. C.
Pub. info.: Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A..  pp.109-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 524
5.

Conference Proceedings
Conference Proceedings
5. PRINCIPAL RESIDUAL STRAINS AS A FUNCTION OF DEPTH FOR SPUTTER DEPOSITED Mo THIN FILMS
Malhotra, S. G. ; Rek, Z. U. ; Parfitt, L. J. ; Yalisove, S. M. ; Bilello, J. C.
Pub. info.: Thin films, stresses and mechanical properties V : symposium held November 28-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.603-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 356
6.

Conference Proceedings
Conference Proceedings
6. Depth Dependence of Residual Strains in Textured Mo Thin Films Using High-Resolution X-ray Diffraction
Malhotra, S. G. ; Rek, Z. U. ; Yalisove, S. M. ; Bilello, J. C.
Pub. info.: Polycrystalline thin films II : structure, properties, and applications : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.127-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 403