1.

Conference Proceedings
Conference Proceedings
1. Investigation of salicide processes for thin film SOI microwave applications
Chen, J. ; Colinge, J.P. ; Flandre, D. ; Gillon, R. ; Raskin, J.P. ; Vanhoenacker, D.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.98-103,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
2.

Conference Proceedings
Conference Proceedings
2. Characterization of SOI MOSFETs at microwave frequencies
Gillon, R. ; Raskin, J.P. ; Vanhoenacker, D. ; Colinge, J.P. ; Dambrine, G.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.149-154,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
3.

Conference Proceedings
Conference Proceedings
3. Influence of a Ductile Interlayer on the Toughness of Hydrophilic Wafer Bonding
Bertholet, Y. ; Raskin, J.P. ; Pardoen, T.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.264-269,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-02
4.

Conference Proceedings
Conference Proceedings
4. Investigation of charge control related performances In double-gate SOI MOSFETs
Kiichytska, V. ; Chung, T.M. ; van Meer, H. ; de Meyer, K. ; Raskin, J.P. ; Flandre, D.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.225-230,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
5.

Conference Proceedings
Conference Proceedings
5. Impact of down scaling on high-frequency noise performance of bulk and SOI MOSFETs (Invited Paper)
Dambrine, G. ; Raynaud, C. ; Vanmackelberg, M. ; Danneville, F. ; Pailloncy, G. ; Lepilliet, S. ; Raskin, J.P.
Pub. info.: Noise in Devices and Circuits.  pp.105-119,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5113