1.

Conference Proceedings
Conference Proceedings
1. Evolution of Basal Plane Dislocations during 4H-SiC Epitaxial Growth
R.E. Stahlbush ; B.L. VanMil ; K.X. Liu ; K.K. Lew ; R.L. Myers-Ward
Pub. info.: Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007.  pp.317-320,  2009.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 600-603
2.

Conference Proceedings
Conference Proceedings
2. Impact of 4H-SiC Substrate Defectivity on Epilayer Injected Carrier Lifetimes
R.L. Myers-Ward ; K.K. Lew ; B.L. VanMil ; R.E. Stahlbush ; K.X. Liu
Pub. info.: Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007.  pp.481-484,  2009.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 600-603
3.

Conference Proceedings
Conference Proceedings
3. Temperature Dependence of the Carrier Lifetime in 4H-SiC Epilayers
P.B. Klein ; R.L. Myers-Ward ; K.K. Lew ; B.L. VanMil ; C.R. Eddy Jr.
Pub. info.: Silicon carbide and related materials 2009 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2009, Nurnberg, Germany, October 11-16, 2009.  pp.203-206,  2010.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 645-648