1.

Conference Proceedings
Conference Proceedings
1. DEGRADATION AND RECOVERY OF BORON DOPED STRAINED SILICON GERMANIUM LAYERS AFTER 1-MeV ELECTRON IRRADIATION
Ohyama, H. ; Vanhellemont, J. ; Trauwaert, M.-A. ; Poortmans, J. ; Caymax, M. ; Clauws, P.
Pub. info.: Semiconductor heterostructures for photonic and electronic applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.433-438,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 281
2.

Conference Proceedings
Conference Proceedings
2. Degradation and Recovery of Si1-xGex Devices by Irradiation
Ohyama, H. ; Vanhellemont, J. ; Takami, Y. ; Hayama, K. ; Kudo, T. ; Hakata, T. ; Kobayashi, K. ; Sunaga, H. ; Hironaka, I. ; Poortmans, J. ; Caymax, M.
Pub. info.: Strained layer epitaxy - materials processing and device applications : symposium held April 17-19, 1995, San Francisco, California, U.S.A..  pp.365-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 379