Gamaes, J. ; Hansen, P.-E. ; Agersnap, N. ; Davi, I. ; Petersen, J. C. ; Kuhie, A. ; Holm, J. ; Christensen, L. H.
Pub. info.:
Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA. pp.587803-587803, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Agersnap, N. ; Hansen, P. -E. ; Petersen, J. C. ; Garnaes, J. ; Destouches, N. ; Parriaux, O.
Pub. info.:
Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany. pp.596508-596508, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
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