Pearton, S. J. ; Ren, F. ; Fullowan, T. R, ; Katz, A. ; Hobson, W. S. ; Abernaty, C. R. ; Lothian, J., R. ; D'Asaro, L. A. ; Elliman, R. G. ; Ridgway, M. C. ; Jagadish, C. ; Williams,. J. S.
Pub. info.:
Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.. pp.763-768, 1992. Pittsburgh, Pa.. Materials Research Society
Hobson, W. S. ; Pearton, S. J. ; Ren, F. ; Chu, S. N. G. ; Bylsma, R. ; Elliman, R. G.
Pub. info.:
III-V electronic and photonic device fabrication and performance : symposium held April 12-15, 1993, San Francisco, California, U.S.A.. pp.107-, 1993. Pittsburgh, Pa.. MRS - Materials Research Society