1.

Conference Proceedings

Conference Proceedings
Oh, S. H. ; Lee, C.-W. ; Kim, K. S. ; Ko, H. ; Park, S. ; Park, M-H. ; Lee, J.-M. ; Kim, S. ; Chung, Y.
Pub. info.: Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea.  pp.63520K-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6352
2.

Conference Proceedings

Conference Proceedings
Byun, I. ; Kim, S. ; Kim, Y. ; Yang, J. ; Park, S.
Pub. info.: Microfluidics, bioMEMS, and medical microsystems III : 24-26 January 2005, San Jose, California, USA.  pp.30-37,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5718
3.

Technical Paper

Technical Paper
Park, J. ; Park, S. ; Moon, J. ; Yoon, Y. ; Kim, S.
Pub. info.: AIAA meeting papers on disc.  2005.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
Ser. no.: 46th
4.

Conference Proceedings

Conference Proceedings
Lee, S. ; Park, S. ; Ahn, M. ; Doh, J. ; Kim, S. ; Kim, B. ; Choi, S. ; Han, W.
Pub. info.: Photomask Technology 2006.  pp.63490X-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6349
5.

Conference Proceedings

Conference Proceedings
Kim, S. ; Kim, Y. ; Yang, J. ; Kwon, S. ; Park, S.
Pub. info.: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V.  pp.61110U-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6111