1.

Conference Proceedings
Conference Proceedings
1. Effect of Crystal Defects Such as COPs, Large Dislocations, and OSF Ring on Device Integrity Degradation
Park, J.G. ; Lee, G.S. ; Park, J.M. ; Chon, S.M. ; Chung, H.K.
Pub. info.: Proceedings of the Third International Symposium on Defects in Silicon.  pp.324-341,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-1
2.

Conference Proceedings
Conference Proceedings
2. Effect of crystal defects on device characteristics
Park, J.G. ; Park, J.M. ; Cho, K.C. ; Lee, G.S. ; Chung, H.K.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.173-195,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22