Technologies for synthetic environments : hardware-in-the-loop testing VI : 16-18 April 2001, Orlando, USA. pp.475-488, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing VI : 16-18 April 2001, Orlando, USA. pp.168-183, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing VI : 16-18 April 2001, Orlando, USA. pp.158-167, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing IV : 5-7 April 1999, Orlando, Florida. pp.403-413, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing III : 13-15 April 1998, Orlando, Florida. pp.342-351, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing III : 13-15 April 1998, Orlando, Florida. pp.202-215, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing III : 13-15 April 1998, Orlando, Florida. pp.321-327, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing III : 13-15 April 1998, Orlando, Florida. pp.189-201, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing III : 13-15 April 1998, Orlando, Florida. pp.328-341, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing V : 24-26 April 2000, Orlando, [Florida] USA. pp.350-367, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing V : 24-26 April 2000, Orlando, [Florida] USA. pp.202-213, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing VI : 16-18 April 2001, Orlando, USA. pp.501-509, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing II : 21-23 April 1997, Orlando, Florida. pp.250-259, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing II : 21-23 April 1997, Orlando, Florida. pp.192-199, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing II : 21-23 April 1997, Orlando, Florida. pp.131-138, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Targets and backgrounds : characterization and representation II : 8-10 April 1996, Orlando, Florida. pp.25-37, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing : 9-11 April 1996, Orlando, Florida. pp.166-178, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing : 9-11 April 1996, Orlando, Florida. pp.201-208, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing : 9-11 April 1996, Orlando, Florida. pp.94-109, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering