1.

Conference Proceedings
Conference Proceedings
1. MULTILAYER ANALYSIS BY FOCUSED MeV ION BEAM
Takai, M. ; Kinomura, A. ; Izumi, M ; Matsunaga, K. ; Inoue, K. ; Gamo, K. ; Satou, M. ; Namba, S.
Pub. info.: Electronic packaging materials science III : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A..  pp.51-58,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 108
2.

Conference Proceedings
Conference Proceedings
2. 0.5 MeV SUBMICRON ION PROBE SYSTEM FOR RBS/PIXE
Inoue, K. ; Takai, M. ; Ishibashi, K. ; Kawata, Y. ; Suzuki, N. ; Namba, S.
Pub. info.: Processing and characterization of materials using ion beams : symposium held November 28-December 2, 1988, Boston, Massachusetts, U.S.A..  pp.381-388,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 128