1.

Conference Proceedings
Conference Proceedings
1. Effect of Gate Profile on the Characteristics of 0.5μm GaAs MESFETs
Naik, A.A. ; Rawal, D.S. ; Prabhakar, S. ; Sai Saravanan, G. ; Sehgal, B.K. ; Gulati, R. ; Vyas, H.P. ; Kumar, Rajesh ; Suryanarayana, P. ; Rao, A.V.S.K. ; Govindacharyulu, P.A.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.1148-1151,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
2.

Conference Proceedings
Conference Proceedings
2. Effect of Various Alloying Cycles on AuGe/Ni/Au Ohmic Contact to p-HEMT
Sharma, H.S. ; Mahajan, Somna S. ; Guru, Vandana ; Rawal, D.S. ; Naik, A.A. ; Agarwal, Vanita R. ; Sehgal, B.K. ; Gulati, R. ; Vyas, P.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.918-921,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
3.

Conference Proceedings
Conference Proceedings
3. Effect of Ion- Beam Milling on Lips Prior to Lift-Off Process
Bhan, R.K. ; Mittal, V. ; Rawal, D.S. ; Naik, A.A. ; Sehgal, B.K. ; Singh, K.P. ; Singh, B.V. ; Aneja, B.R. ; Sharma, B.L. ; Singh, R. ; Gopal, V.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.1049-1052,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746