1.

Conference Proceedings

Conference Proceedings
Mueller,J. ; Yang,E.-H. ; Green,A.A. ; White,V. ; Chakraborty,I. ; Reinicke,R.H.
Pub. info.: Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Trancisco, USA.  pp.57-71,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4558
2.

Conference Proceedings

Conference Proceedings
Vargo,S.E. ; Green,A.A. ; Mueller,J. ; Bame,D.P. ; Reinicke,R.H.
Pub. info.: MEMS Reliability for Critical Applications.  pp.76-83,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4180