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Conference Proceedings

1. Characterization of modulation-doped n-AlxGa1-xAs/GaAs heterostructure using spectroscopic ellipsometry and photoreflectance

Wong,C.C. ; Mochizuki,M. ; Yaguchi,H. ; Saitoh,T. ; Xiong,Y.-M.

Pub. info.:	International Symposium on Polarization Analysis and Applications to Device Technology. pp.226-229, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2873

Conference Proceedings

2. Characterization of Sio-doped GaAs using photoellipsometry and photoreflectance

Mochizuki,M. ; Kobayashi,K. ; Yaguchi,H. ; Saitoh,T. ; Xiong,Y.-M.

Pub. info.:	International Symposium on Polarization Analysis and Applications to Device Technology. pp.270-273, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2873