1.

Conference Proceedings
Conference Proceedings
1. Characterization and modeling of Defects in High-k Layers Through Fast Electrical Transient Measurements
Mitard, J. ; Leroux, C. ; Reimbold, G. ; Garros, X. ; Martin, F. ; Ghibaudo, G.
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.73-85,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
2.

Conference Proceedings
Conference Proceedings
2. Electrical Characterization of High k Devices: Charges and Traps Effects on Instability, Reliability and Mobility Behavior
Reimbold, G. ; Mitard, J. ; Casse, M. ; Garros, X. ; Leroux, C. ; Thevenod, L. ; Martin, F.
Pub. info.: Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium.  pp.437-455,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-01