1.

Conference Proceedings
Conference Proceedings
1. ELECTROLUMINESCENCE FROM μc-SiC/POROUS Si PN JUNCTIONS
Mimura, H. ; Futagi, T. ; Matsumoto, T. ; Ohta, Y. ; Kitamura, K. ; Kanemitsu, Y.
Pub. info.: Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A..  pp.385-390,  1993.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 298
2.

Conference Proceedings
Conference Proceedings
2. OPTICAL PROPERTIES OF FREE-STANDING POROUS Si FILMS
Kanemitsu, Y. ; Uto, H. ; Matsumoto, Y. ; Futagi, T. ; Mimura, H.
Pub. info.: Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A..  pp.265-270,  1993.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 298
3.

Conference Proceedings
Conference Proceedings
3. VISIBLE PHOTOLUMINESCENCE FROM POROUS SILICON CARBIDE
Matsumoto, T. ; Tamaki, T. ; Futagi, T. ; Mimura, H. ; Kanemitsu, Y.
Pub. info.: Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A..  pp.355-360,  1993.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 298
4.

Conference Proceedings
Conference Proceedings
4. VISIBLE ELECTROLUMINESCENCE FROM PN JUNCTION TYPE μc-SiC/POROUS Si/c-Si STRUCTURES
Futagi, T. ; Matsumoto, T. ; Katsuno, M. ; Ohta, Y. ; Mimura, H. ; Kitamura, K.
Pub. info.: Microcrystalline semiconductors : materials science & devices : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.389-394,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 283
5.

Conference Proceedings
Conference Proceedings
5. PHOTOCHEMICAL ETCHING EFFECTS ON OPTICAL PROPERTIES OF POROUS SILICON
Kanemitsu, Y. ; Uto, H. ; Masumoto, Y. ; Matsumoto, T. ; Futagi, T. ; Mimura, H.
Pub. info.: Microcrystalline semiconductors : materials science & devices : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.221-226,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 283
6.

Conference Proceedings
Conference Proceedings
6. PICOSECOND DECAY DYNAMICS IN POROUS SILICON
Matsumoto, T. ; Futagi, T. ; Mimura, H. ; Kanemitsu, Y.
Pub. info.: Microcrystalline semiconductors : materials science & devices : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.149-154,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 283
7.

Conference Proceedings
Conference Proceedings
7. Development of a figure correction method having spatial resolution close to 0.1 mm
Mori, Y. ; Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T.
Pub. info.: Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA.  pp.105-111,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5193
8.

Conference Proceedings
Conference Proceedings
8. Fabrication technology of hard x-ray aspherical mirror optics and application to nanospectroscopy
Mori, Y. ; Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Shimura, M. ; Ishizaka, Y.
Pub. info.: Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA.  pp.11-17,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5193
9.

Conference Proceedings
Conference Proceedings
9. Hard x-ray nano-focusing of 40nm level using K-B mirror optics for nanoscopy/spectroscopy [5918-05]
Matsuyama, S. ; Mimura, H. ; Yumoto, H. ; Hara, H. ; Yamamura, K. ; Sano, Y. ; Endo, K. ; Mori, Y. ; Nishino, Y. ; Tamasaku, K. ; Yabashi, M. ; Tshikawa, T. ; Yamauchi, K.
Pub. info.: Laser-generated, synchrotron, and other laboratory X-ray and EUV sources, optics, and applications II : 2-4 August 2005, San Diego, California, USA.  pp.591804-591804,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5918
10.

Conference Proceedings
Conference Proceedings
10. VISIBLE PHOTOLUMINESCENCE FROM RAPID-THERMAL-OXIDIZED POROUS SILICON
Kanemitsu, Y. ; Matsumoto, T. ; Futagi, T. ; Mimura, H.
Pub. info.: Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A..  pp.205-210,  1993.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 298
11.

Conference Proceedings
Conference Proceedings
11. INITIAL STAGE CARRIER DYNAMICS IN POROUS SILICON USING ULTRAFAST SPECTROSCOPY
Matsumoto, T. ; Wright, O.B. ; Futagi, T. ; Mimura, H. ; Kanemitsu, Y.
Pub. info.: Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A..  pp.199-204,  1993.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 298
12.

Conference Proceedings
Conference Proceedings
12. Fabrication of Si field emitters with a focus electrode [6030-01]
Mimura, H. ; Neo, Y. ; Shimawaki, H.
Pub. info.: ICO20 : display devices and systems : 21-26 August, 2005, Changchun, China.  pp.603001-603001,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6030
13.

Conference Proceedings
Conference Proceedings
13. * A HIGH SPEED CONTACT-TYPE IMAGE SENSOR USING AMORPHOUS SILICON ALLOY PIN DIODES
Kitamura, K. ; Mimura, H. ; Tsukada, K. ; Nakayama, T. ; Yamaguchi, M. ; Tawada, Y.
Pub. info.: Amorphous silicon technology, 1992.  pp.1115-1126,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 258
14.

Conference Proceedings
Conference Proceedings
14. High-spatial-resolution scanning x-ray fluorescence microscope with Kirkpatrick-Baez mirrors [6317-48]
Matsuyama, S. ; Mimura, H. ; Shimura, M. ; Yumoto, H. ; Katagishi, K. ; Handa, S. ; Shibatani, A. ; Sano, Y. ; Yamamura, K. ; Nishino, Y. ; Tamasaku, K. ; Yabashi, M. ; Ishikawa, T. ; Yamauchi, K.
Pub. info.: Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA.  pp.631719-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6317
15.

Conference Proceedings
Conference Proceedings
15. Wave-optical simulations for designing and evaluating hard x-ray reflective optics [6317-47]
Mimura, H. ; Matsuyama, S. ; Yumoto, H. ; Handa, S. ; Shibatani, A. ; Katagishi, K. ; Sano, Y. ; Nishino, Y. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Yamauchi, K.
Pub. info.: Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA.  pp.631718-631718,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6317
16.

Conference Proceedings
Conference Proceedings
16. Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories [5921-21]
Assoujfid, L. ; Rommeveaux, A. ; Ohashi, H. ; Yamauchi, K. ; Mimura, H. ; Qian, J. ; Hignette, O. ; Ishikawa, T. ; Morawe, C. ; Macrander, A. ; Khounsary, A. ; Goto, S.
Pub. info.: Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA.  pp.59210J-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5921
17.

Conference Proceedings
Conference Proceedings
17. Surface figuring and measurement methods with spatial resolution close to 0.1 mm for x-ray mirror frabrication [5921-24]
Mimura, H. ; Yumoto, H. ; Matsuyama, S. ; Yamamura, K. ; Sano, Y. ; Endo, K. ; Mori, Y. ; Nishino, Y. ; Tabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Yamauchi, Y.
Pub. info.: Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA.  pp.59210M-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5921
18.

Conference Proceedings
Conference Proceedings
18. Field emitter type CdTe radiation detector for x-ray imager [6319A-53]
Sakata, T. ; Ikeda, Y. ; Shiozawa, K. ; Neo, Y. ; Morii, H. ; Aoki, T. ; Mimura, H.
Pub. info.: Hard X-ray and gamma-ray detector physics and Penetrating radiation systems VIII : 14-17 August 2006, San Diego, California, USA.  pp.63190O-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6319
19.

Conference Proceedings
Conference Proceedings
19. At-wavelength figure metrology of total reflection mirrors in hard x-ray region (Invited Paper) [6317-09]
Yumoto, H. ; Mimura, H. ; Matsuyama, S. ; Handa, S. ; Shibatani, A. ; Katagishi, K. ; Sano, Y. ; Yabashi, M. ; Nishino, Y. ; Tamasaku, K. ; Ishikawa, T. ; Yamauchi, K.
Pub. info.: Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA.  pp.631709-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6317
20.

Conference Proceedings
Conference Proceedings
20. SURFACE ALTERATION OF SINTERED PRODUCT OF STRONTIUM ALUMINUM SILICATE UNDER HYDROTHERMAL CONDITIONS
Mimura, H. ; Koyama, A. ; Akiba, K.
Pub. info.: Scientific basis for nuclear waste management XVIII : symposium held October 23-27, 1994, Kyoto, Japan.  pp.863-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 353
21.

Conference Proceedings
Conference Proceedings
21. Aspheric surface fabrication in nanometer-level accuracy by numerically controlled plasma chemical vaporization machining (CVM) and elastic emission machining (EEM)
Yamamura, K. ; Mimura, H. ; Yamauchi, K. ; Sano, Y. ; Saito, A. ; Kinoshita, T. ; Endo, K. ; Mori, Y. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T.
Pub. info.: X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA.  pp.265-270,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4782
22.

Conference Proceedings
Conference Proceedings
22. Wave-optical analysis of submicron focusing of hard x-ray beams by reflective optics
Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Kanaoka, M. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Mori, Y.
Pub. info.: X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA.  pp.271-276,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4782
23.

Conference Proceedings
Conference Proceedings
23. Submicron focusing of hard x-ray beam by elliptically figured mirrors for scanning x-ray microscopy
Mori, Y. ; Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Ueno, K. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T.
Pub. info.: X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA.  pp.58-64,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4782
24.

Conference Proceedings
Conference Proceedings
24. OPTICALLY INDUCED ABSORPTION IN POROUS SILICON AND ITS APPLICATION TO LOGIC GATES
Matsumoto, T. ; Futagi, T. ; Hasegawa, N. ; Mimura, H. ; Kanemitsu, Y.
Pub. info.: Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology.  pp.545-551,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-10
25.

Conference Proceedings
Conference Proceedings
25. Fabrication technology of ultraprecise mirror optics to realize hard x-ray nanobeam
Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Matsuyama, S. ; Yumoto, H. ; Ueno, K. ; Shibahara, M. ; Endo, K. ; Yabashi, M. ; Tamasaku, K. ; Nishino, Y. ; Ishikawa, T. ; Mori, Y.
Pub. info.: Advances in mirror technology for X-ray, EUV lithography, laser, and other applications II : 5 August 2004, Denver, Colorado, USA.  pp.116-123,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5533
26.

Conference Proceedings
Conference Proceedings
26. Microstitching interferometry for nanofocusing mirror optics
Mimura, H. ; Yumoto, H. ; Matsuyama, S. ; Yamamura, K. ; Sano, Y. ; Ueno, K. ; Endo, K. ; Mori, Y. ; Yabashi, M. ; Tamasaku, K. ; Nishino, Y. ; Ishikawa, T. ; Yamauchi, K.
Pub. info.: Advances in mirror technology for X-ray, EUV lithography, laser, and other applications II : 5 August 2004, Denver, Colorado, USA.  pp.171-180,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5533
27.

Conference Proceedings
Conference Proceedings
27. Wave-optical and ray-tracing analysis to establish a compact two-dimensional focusing unit using K-B mirror arrangement
Matsuyama, S. ; Mimura, H. ; Yamamura, K. ; Yumoto, H. ; Sano, Y. ; Endo, K. ; Mori, Y. ; Yabashi, M. ; Tamasaku, K. ; Nishino, Y. ; Ishikawa, T. ; Yamauchi, K.
Pub. info.: Advances in mirror technology for X-ray, EUV lithography, laser, and other applications II : 5 August 2004, Denver, Colorado, USA.  pp.181-192,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5533
28.

Conference Proceedings
Conference Proceedings
28. BLUE AND GREEN ELECTROLUMINESCENCE FROM POROUS MATERIALS
Mimura, H. ; Matsumoto. T. ; Kanemitsu, Y.
Pub. info.: Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.635-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 358
29.

Conference Proceedings
Conference Proceedings
29. Electronic transport modification of single-walled carbon nanotubes by encapsulating alkali-metal ions
Izumida, T. ; Jeong, G.-H. ; Hirata, T. ; Hatakeyama, R. ; Neo, Y. ; Mimura, H.
Pub. info.: Nanotechnology II.  pp.208-215,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5838
30.

Conference Proceedings
Conference Proceedings
30. Electron emission from polycrystalline diamond film with new structure
Yuan, G. ; Song, H. ; Li, S. ; Jiang, H. ; Miao, G. ; Jin, Y. ; Mimura, H. ; Yokoo, K.
Pub. info.: Materials, Devices, and Systems for Display and Lighting.  pp.151-154,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4918