1.

Conference Proceedings
Conference Proceedings
1. An Examination of the Crystalline Quality of 200-mm-Diameter Silicon Substrates Using X-ray Topography
Curley, J. ; McNally, P. J. ; Reader, A. ; Tuomi, T. ; Taskinen, M. ; Rantamaki, R. ; Danilewsky, A. ; Schropp, B.
Pub. info.: Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.83-,  1997.  Pittsburg, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 469
2.

Conference Proceedings
Conference Proceedings
2. Structural and optoelectronic properties of sputtered copper (I) chloride
Natarajan, G. ; O'Reilly, L. ; Daniels, S. ; Cameron, D. C. ; McNally, P. J. ; Lucas, O. ; Reader, A. ; Mitra, A. ; Bradley, L.
Pub. info.: Opto-Ireland 2005: Optoelectronics, Photonic Devices, and Optical Networks.  pp.364-369,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5825
3.

Conference Proceedings
Conference Proceedings
3. The use of wide-bandgap CuCl on silicon for ultra-violet photonics
O'Reilly, L. ; Natarajan, G. ; McNally, P. J. ; Daniels, S. ; Lucas, O. F. ; Mitra, A. ; Martinez-Rosas, M. ; Bradley, L. ; Reader, A. ; Cameron, D.
Pub. info.: Opto-Ireland 2005: Optoelectronics, Photonic Devices, and Optical Networks.  pp.29-36,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5825