1.

Conference Proceedings
Conference Proceedings
1. In-situ aberration monitoring using phase wheel targets
Zavyalova, L.V. ; Smith, B.W. ; Suganaga, T. ; Matsuura, S. ; Itani, T. ; Cashmore, J.S.
Pub. info.: Optical Microlithography XVII.  pp.172-184,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377
2.

Conference Proceedings
Conference Proceedings
2. 157-nm chromeless phase lithography with extremely high numerical aperture
Watanabe, K. ; Hagiwara, T. ; Matsuura, S. ; Suganaga, T. ; Itani, T. ; Fujii, K.
Pub. info.: Optical Microlithography XVII.  pp.537-544,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377
3.

Conference Proceedings
Conference Proceedings
3. 157-nm chromeless phase lithography for 45-nm SRAM gate
Suganaga, T. ; Watanabe, K. ; Matsuura, S. ; Hagiwara, T. ; Furukawa, T. ; Itani, T. ; Fujii, K.
Pub. info.: Optical Microlithography XVII.  pp.1616-1626,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377