1.

Conference Proceedings
Conference Proceedings
1. Through-hole processing of aluminum nitride and silicon wafers using short-pulse lasers
Deki, K. ; Kanai, M. ; Takizawa, H. ; Matsuoka, F. ; Arisawa, T.
Pub. info.: Fifth International Symposium on Laser Precision Microfabrication : 11-14 May, 2004, Nara, Japan.  pp.633-637,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5662
2.

Conference Proceedings
Conference Proceedings
2. X-ray spectroscopic study on femto- and pico-second laser irradiated solid and gaseous targets
Suzuki, M. ; Daido, H. ; Matsuoka, F. ; Yanase, E. ; Nishiuchi, M. ; Suto, K. ; Sasaki, A. ; Yamakawa, K. ; Kawachi, T. ; Nagashima, K. ; Oketa, T. ; Nakayama, T. ; Uschmann, I. ; Foerster, E. ; Fiedorowicz, H.
Pub. info.: ECLIM 2002 : 27th European Conference on Laser Interaction with Matter : 7-11 October 2002, Moscow, Russia.  pp.353-360,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5228
3.

Conference Proceedings
Conference Proceedings
3. Correlation Between Defects and Electrical Conduction in Surface Conductive Layer of CVD Diamond Films
Show, Y. ; Matsuoka, F. ; Ri, S. ; Akiba, Y. ; Kurosu, T. ; Iida, M. ; Izumi, T.
Pub. info.: Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.681-,  1997.  Pittsburgh, Penn.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 442
4.

Conference Proceedings
Conference Proceedings
4. Analysis of soft errors in floating channel type surrounding gate transistor (FC-SGT) DRAM cells
Matsuoka, F. ; Masuoka, F.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.431-436,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5