1.

Conference Proceedings
Conference Proceedings
1. Comprehensive Optical and Compositional Characterization of Silicon-based Thin Films for Photonics
Wojcik, J. ; Irving, E.A. ; Davies, J.A. ; Lennard, W.N. ; Mascher, P.
Pub. info.: Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium.  pp.381-395,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-2
2.

Conference Proceedings
Conference Proceedings
2. Optical Coatings for Improved Semiconductor Diode Laser Performance
Mascher, P. ; Boudreau, M. ; Wallace, S.G. ; Murugkar, S. ; Balcaitis, G. ; Wettlaufer, Ch. ; Haugen, H.K.
Pub. info.: Proceedings of the Symposium on Light Emitting Devices for Optoelectronic Applications and the Twenty-Eighth State-of-the-Art Program on Compound Semiconductors.  pp.56-67,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-2
3.

Conference Proceedings
Conference Proceedings
3. Characterization of Silicon Oxynitride Thin Films Deposited By ECR-PECVD
Simionescu, C. ; Wojcik, J. ; Haugen, H.K. ; Davies, J.A. ; Mascher, P.
Pub. info.: Silicon Nitride and Silicon Dioxide Thin Insulating Films : proceedings of the sixth International Symposium.  pp.206-213,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-7
4.

Conference Proceedings
Conference Proceedings
4. Bulk Studies of Defects in Semiconductors
Mascher, P.
Pub. info.: Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany.  pp.30-34,  2001.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 363-365
5.

Conference Proceedings
Conference Proceedings
5. Influence of the Microwave Power in an ECR-PECVD Reactor on Dielectric-Cap Induced Blue Shifi in 1.55 μm Laser Structures
Wojcik, J. ; Robinson, B. ; Thompson, D.A. ; Mascher, P.
Pub. info.: Chemical vapor deposition XVI and EUROCVD 14 : proceedings of the international symposium.  pp.624-629,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-8
6.

Conference Proceedings
Conference Proceedings
6. Evaluation of Precursors for the Chemical Vapour Deposition of Tin Oxide
Siminsescu, C. ; Bounasri, F. ; Wallace, S.G. ; Haugen, H.K. ; Davies, J.A. ; Mascher, P.
Pub. info.: CVD XV, proceedings of the fifteenth International Symposium on Chemical Vapor Deposition.  pp.765-772,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-13
7.

Conference Proceedings
Conference Proceedings
7. ANNEALING OF GROWN-IN DEFECTS IN GaAs
Dannefaer, S. ; Mascher, P. ; Kerr, D.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.471-474,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
8.

Conference Proceedings
Conference Proceedings
8. THE INFLUENCE OF THERMAL TREATMENT ON DEFECT CHARACTERISTICS IN CZ-SILICON WAFERS INVESTIGAGED BY POSITRON ANNIHILATION SPECTROSCOPY
Mascher, P. ; Puff, W. ; Hahn, S. ; Cho. K. H. ; Lee, B. Y.
Pub. info.: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.665-670,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 262
9.

Conference Proceedings
Conference Proceedings
9. Point Defect Characterization of Zn- and Cd-Based Semiconductors Using Positron Annihilation Techniques
Tessaro, G. ; Mascher, P.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.583-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510
10.

Conference Proceedings
Conference Proceedings
10. Vacancy-Type Defects in Electron and Proton Irradiated II-VI Compounds
Brunner, S. ; Puff, W. ; Mascher, P. ; Balogh, A. G. ; Baumann, H.
Pub. info.: Materials modification and synthesis by ion beam processing : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A..  pp.235-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 438
11.

Conference Proceedings
Conference Proceedings
11. Electron cyclotron resonance CVD of silicon oxynitride for optoelectronic applications
Boudreau, M. ; Boumerzoug, M. ; Kruzelecky, R. V. ; Mascher, P. ; Jessop, P. E. ; Thompson, D. A.
Pub. info.: III-V electronic and photonic device fabrication and performance : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.183-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 300
12.

Conference Proceedings
Conference Proceedings
12. Proton Irradiation Induced Defects in 6H- and 4H-SiC
Puff, W. ; Balogh, A. G. ; Mascher, P.
Pub. info.: Microstructural processes in irradiated materials : symposium held November 30-December 2, 1998, Boston, Massachusetts, U.S.A..  pp.177-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 540
13.

Conference Proceedings
Conference Proceedings
13. Vacancy-Type Defects in Electron and Proton-Irradiated II-VI Compounds
Brunner, S. ; Puff, W. ; Mascher, P. ; Balogh, A. G.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.437-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510
14.

Conference Proceedings
Conference Proceedings
14. Defect Identification in (La,Sr)CoO3-ｦﾄ Using Positron Annihilation Spectroscopy
Friessnegg, T. ; Nielsen, B. ; Ghosh, V. J. ; Moodenbaugh, A. R. ; Madhukar, S. ; Aggarwal, S. ; Keeble, D. J. ; Poindexter, E. H. ; Mascher, P. ; Ramesh, R.
Pub. info.: Ferroelectric thin films VII : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A..  pp.161-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 541
15.

Conference Proceedings
Conference Proceedings
15. Incorporation of Hydrogen in SiO2 and Si3N4 Thin Films Deposited by ECR-CVD
Brown, J. ; Boudreau, M. ; Boumerzoug, M. ; Mascher, P. ; Jackman, T. E. ; Tong, S. Y. ; Haugen, H.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.1037-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378
16.

Conference Proceedings
Conference Proceedings
16. Passivation Studies on AlGaAs Surfaces Suitable for High Power Laser Development
Edirisinghe, C. ; Ruda, H. E. ; Koutzarov, I. ; Liu, Q. ; Jedral, L. ; Boudreau, M. G. ; Boumerzoug, M. ; Brown, J. ; Mascher, P. ; Moore, A. ; Henderson, R.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.1007-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378
17.

Conference Proceedings
Conference Proceedings
17. Microstructural Evolution of Radiation Induced Defects in ZnO During Isochronal Annealing
Brunner, S. ; Puff, W. ; Mascher, P. ; Balogh, A. G.
Pub. info.: Microstructural processes in irradiated materials : symposium held November 30-December 2, 1998, Boston, Massachusetts, U.S.A..  pp.207-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 540
18.

Conference Proceedings
Conference Proceedings
18. Radiation-Induced Defects in Electron and Proton Irradiated ZnS
Brunner, S. ; Puff, W. ; Mascher, P. ; Balogh, A. G.
Pub. info.: Microstructural processes in irradiated materials : symposium held November 30-December 2, 1998, Boston, Massachusetts, U.S.A..  pp.213-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 540
19.

Conference Proceedings
Conference Proceedings
19. Vacancy-Type Defects in Electron and Proton Irradiated II-VI Compounds
Brunner, S. ; Puff, W. ; Mascher, P. ; Balogh, A. G. ; Baumann, H.
Pub. info.: Microstructure evolution during irradiation : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A..  pp.185-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 439
20.

Conference Proceedings
Conference Proceedings
20. Silicon nanocrystal formation in silicon-rich silicon oxide thin films
Roschuk, T. R. ; Wojcik, J. ; Irving, E. A. ; Flynn, M. ; Mascher, P.
Pub. info.: Applications of photonic technology [7A] : closing the gap between theory, development, and application : 7A--Photonics North 2004: Optical components and devices.  pp.450-458,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5577
21.

Conference Proceedings
Conference Proceedings
21. Characterization of Radiation- Induced Defects in ZnO Probed by Positron Annihilation Spectroscopy
Brunner, S. ; Puff, W. ; Balogh, Adam G. ; Mascher, P.
Pub. info.: Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany.  pp.141-143,  2001.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 363-365
22.

Conference Proceedings
Conference Proceedings
22. The Influence of the Incorporation and Desorption of CHn Groups on the Defect Structure of α-SiC:H Films
Friessnegg, T. ; Boudreau, M. ; Mascher, P. ; Simpson, P. J. ; Puff, W.
Pub. info.: Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.667-,  1997.  Pittsburgh, Penn.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 442
23.

Conference Proceedings
Conference Proceedings
23. Optical Properties of Nanostructures Based on Silicon Rich Silicon Oxide (SRSO) Thin Films
Roschuk, T. ; Wojcik, J. ; Comedi, D. ; Flynn, M.J. ; Irving, E.A. ; Zalloum, O.H.Y. ; Mascher, P.
Pub. info.: Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium.  pp.136-147,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-01
24.

Conference Proceedings
Conference Proceedings
24. Decomposition of Tris Dimethylaminosilane in an ECR CVD Reactor
Boudreau, M.G. ; Boumerzoug, M. ; Mascher, P. ; Jossop, P.E.
Pub. info.: Proceedings of the tenth symposium on plasma processing.  pp.536-545,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-20
25.

Conference Proceedings
Conference Proceedings
25. Electron Cyclotron Resonance Plasma Enhanced Chemical Vapour Depo- sition (ECR-PECVD): A Versatile Tool in the Fabrication of Optoelectronic Devices
Wojcik, J. ; Mascher, P.
Pub. info.: Integrated optoelectronics : proceedings of the first international symposium.  pp.3-22,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-4
26.

Conference Proceedings
Conference Proceedings
26. Microstructural Evolution of Radiation-Induced Defects in Semi-Insulating SiC During Isochronal Annealing
Puff, W. ; Balogh, A. G. ; Mascher, P.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.965-968,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
27.

Conference Proceedings
Conference Proceedings
27. Vacancy-Type Defects in Proton-Irradiated 6H- and 4H-SiC: A Systematic Study with Positron Annihilation Techniques
Puff, W. ; Balogh, A. G. ; Mascher, P.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.969-972,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
28.

Conference Proceedings
Conference Proceedings
28. Applications of defect engineering to the fabrication of silicon-based photonic devices
Foster, P. J. ; Doylend, J. K. ; Mascher, P. ; Knights, A. P. ; Coleman, P. G.
Pub. info.: Applications of photonic technology [7A] : closing the gap between theory, development, and application : 7A--Photonics North 2004: Optical components and devices.  pp.683-690,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5577
29.

Conference Proceedings
Conference Proceedings
29. Defect Characterization of Barium Titanates, Tantalates and Niobates by PAS and ESR
Kolodiazhnyi, T. ; Younker, A. ; Malysz, P. ; Mascher, P.
Pub. info.: Positron annihilation ICPA-13 : proceedings of the 13th International Conference on Positron Annihilation, Kyoto, Japan, September 2003.  pp.129-131,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 445-446
30.

Conference Proceedings
Conference Proceedings
30. Defect Characterization of InAs Wafers Using Positron Lifetime Spectroscopy
Mahony, J. ; Mascher, P.
Pub. info.: Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.547-,  1997.  Pittsburgh, Penn.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 442
31.

Conference Proceedings
Conference Proceedings
31. CdTe:Ge/Si (100) thin films grown by pulsed laser deposition (PLD) for photonic devices [5970-35]
Neretina, S. ; Hughes, R.A. ; Preston, J.S. ; Sochinskii, N.V. ; Mascher, P.
Pub. info.: Photonic Applications in Devices and Communication Systems.  pp.59700Y-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5970
32.

Conference Proceedings
Conference Proceedings
32. Erbium doped silicon rich silicon oxide luminescent thin films deposited by ECR-PECVD [5970-118]
Blakie, D. ; Zalloum, O.H.Y. ; Wojcik, J. ; Irving, E.J. ; Knights, A.P. ; Mascher, P.
Pub. info.: Photonic Applications in Devices and Communication Systems.  pp.597013-597013,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5970
33.

Conference Proceedings
Conference Proceedings
33. Coupled luminescence centres in erbium-doped silicon rich silicon oxide thin films [6343-133]
Blakie, D. E. ; Zalloum, O. H. Y. ; Wojcik, J. ; Irving, E. J. ; Knights, A. P. ; Mascher, P.
Pub. info.: Photonics North 2006.  pp.63433S-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6343