X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA. pp.185-195, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Loyen, L. ; Boettger, T. ; Braun, S. ; Mai, H. ; Leson, A. ; Scholze, F. ; Tuemmler, J. ; Ulm, G. ; Legall, H. ; Nickles, P.V. ; Sandner, W. ; Stiel, H. ; Rempel, C.E. ; Schulze, M. ; Brutscher, J. ; Macco, F. ; Muellender, S.
Pub. info.:
Metrology, Inspection, and Process Control for Microlithography XVII. 1 pp.12-21, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering