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Conference Proceedings

1. Thickness Contour Mapping of SiC Epi-Films on SiC Substrates

MacMillan,M.F. ; Narfgren,P.O. ; Henry,A. ; Janzen,E.

Pub. info.:	Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997. Part1 pp.645-648, 1998. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	264-268

Conference Proceedings

2. Cathodoluminescence of Defect Regions in SiC Epi-Films

MacMillan,M.F. ; Hultman,L. ; Hallin,C. ; Ivanov,I.G. ; Henry,A. ; Janzen,E. ; Galloway,S.A.

Pub. info.:	Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997. Part1 pp.653-656, 1998. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	264-268