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Two- and three-dimensional methods for inspection and metrology IV : 1-3 October, 2006, Boston, Massachusetts, USA. 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Two- and three-dimensional methods for inspection and metrology VI : 10-11 August 2008, San Diego, California, USA. pp.706608-1-706608-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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