1.

Conference Proceedings
Conference Proceedings
1. Substrate bias effect on preparation of nanocrystalline silicon carbide thin films in helicon wave plasma chemical vapor depostion [6029-34]
Yu W. ; Lu W. ; Wang C. ; Ding W. ; Fu G.
Pub. info.: ICO20 : materials and nanostructures : 21-26 August, 2005, Changchun, China.  pp.60290Y-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6029
2.

Conference Proceedings
Conference Proceedings
2. Phase mapping of the poling process in the RuO2:LiNbO3 crystal by digital holographic interferometry [6293-34]
Qu W. ; Liu D. ; Zhi Y. ; Luan Z. ; Wang C. ; Lu W. ; Liu L.
Pub. info.: Interferometry XIII: Applications.  pp.62930X-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6293
3.

Conference Proceedings
Conference Proceedings
3. Effect of radio frequency bias on the optical and structural properties of nanocrystalline SiC films deposited by helicon wave plasma enhanced chemical vapor deposition [6020-122]
Yu W. ; Wang C. ; Lu W. ; Cui S. ; Fu G.
Pub. info.: Optoelectronic Materials and Devices for Optical Communications.  pp.60203D-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6020