1.

Conference Proceedings
Conference Proceedings
1. ANALYSIS OF HIGH-DOSE IMPLANTED SILICON BY HIGH-DEPTH RESOLUTION RBS AND SPECTROSCOPIC ELLIPSOMETRY AND TEM
Lohner, T. ; Mezey, G. ; Fried, M. ; Ghita, L. ; Ghita, C. ; Mertens, A. ; Kerkow, H. ; Kotai, E. ; Paszti, F. ; Banyai, F. ; Vizkelethy, G. Y. ; Jaroli, E. ; Gyulai, J. ; Somogyi, M.
Pub. info.: Energy beam-solid interactions and transient thermal processing/1984 : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A..  pp.523-528,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 35
2.

Conference Proceedings
Conference Proceedings
2. LIGHT EMISSION VERSUS EXCITATION FROM POROUS STRUCTURES IN ION-IMPLANTED SILICON
Vazsonyi, E. ; Barsony, I. ; Lohner, T. ; Fried, M. ; Erostyak, J. ; Racz, M. ; Paszti, F.
Pub. info.: Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.653-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 358
3.

Conference Proceedings
Conference Proceedings
3. RAPID THERMAL OXIDATION FOR PASSIVATION OF POROUS SILICON
Barsony, I. ; Klappe, J. G. E. ; Vazsonyi, E. ; Lohner, T. ; Fried, M.
Pub. info.: Rapid thermal and integrated processing III : symposium held April 4-7, 1994, San Francisco, California, U.S.A..  pp.91-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 342