1.

Conference Proceedings
Conference Proceedings
1. A New Method of Mapping and Counting Micropipes In SiC Wafers
Wan, J.W. ; Park, S.H. ; Chung, G. ; Carlson, E. ; Loboda, M.J.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.447-450,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
2.

Conference Proceedings
Conference Proceedings
2. Simple, Calibrated Analysis and Mapping of SiC Wafer Defects by Birefringence Imaging
Park, S.H. ; Loboda, M.J. ; Spaulding, M.J.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.721-724,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529